JDSU MAP 280 Multiple Application Platform

JDSU MAP 280 Multiple Application Platform

JDSU MAP 200 Series Multiple Application Platforms are an optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements. Today’s rapidly changing optical market requires investment in productivity-enhancing technologies and tools, making the MAP-200 scalable test platform the right tool needed in even the most stringent environments. Based on the previous-generation Multiple Application Platform (MAP).

The MAP-200 builds on the differentiation of offering the broadest portfolio of modules in the densest and most configurable platform. The MAP-200 is optimized for test applications in lab and manufacturing environments ranging from insertion loss testing to dispersion penalty testing.

Features :

• DVI Port for External Display
• GPIB and LXI-Compliant (Ethernet)
• USB Device Ports for External Keyboard and Mouse
• Field Replaceable Controller/Power Supply Module